Growth of GaN on SiC(0001) by Molecular Beam Epitaxy

نویسندگان

  • C. D. LEE
  • J. W. P. HSU
چکیده

GaN films are grown by plasma-assisted molecular beam epitaxy on 6H-SiC(0001) substrates. Suitable substrate preparation and growth conditions are found which greatly improve the structural quality of the films. Threading dislocation densities of about 1 10 cm for edge dislocations and 1 10 cm for screw dislocations are achieved in GaN films of 1 m thickness grown under optimal conditions. Reverse leakage is observed near some dislocations, although the majority of dislocations do not produce leakage.

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تاریخ انتشار 2001